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Nova Measuring Instruments Ltd. - Ordinary Shares (NASDAQ:NVMI), Down By 11.24% ($0.94) From $8.360 After BUYINS.NET Report Pre

^{Published on 2012-05-16 13:42:47 - WOPRAI}
 

May 16, 2012 / M2 PRESSWIRE / BUYINS.NET, www.buyins.net , a provider of unique trading technologies, released a report on Wednesday, May 9th 2012 stating that Nova Measuring Instruments Ltd. - Ordinary Shares (NASDAQ:NVMI) was expected to go Down due to the Bearish conditions presented in the following report. Click here to view the BUYINS.NET report: http://www.buyins.net/releases/?sym=nvmi&id=272900

At the time this story was written, Nova Measuring Instruments Ltd. - Ordinary Shares (NASDAQ:NVMI) is Down By $0.94 (11.24%) since the BUYINS.NET report was released.

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Nova Measuring Instruments Ltd. - Ordinary Shares (NASDAQ:NVMI) - Nova Measuring Instruments Ltd. (Nova), incorporated in May 1993, is a designer, developer and producer of integrated process control metrology systems used in the manufacture of semiconductors. Nova also designs, manufactures and produces stand-alone process control metrology systems. The Company supplies its metrology systems to major semiconductor manufacturers worldwide, either directly or through process equipment manufacturers. Users of the Company's systems include Intel, Samsung, TSMC, UMC, IBM, AMD and Micron Technology. Process equipment manufacturers that purchase Nova's metrology systems include Applied Materials, Ebara, Novellus and Lam Research.

The Company's integrated metrology systems provide semiconductor manufacturers with process control by measuring wafers and their properties without removing the wafer from the process equipment. Nova's products use its measuring methods that enable the Company to produce optical measuring systems that are small enough to be incorporated directly inside many types of equipment used in semiconductor processing. Integrated systems measure the wafer within the actual process environment, reducing labor and wafer handling, as well as the risk of contamination of or damage to the wafer.

Nova provides its customers with integrated process control solutions by offering systems that meet thin film measurement needs in critical applications in the fabrication process. The Company's integrated process control platform can be deployed to multiple processes and applications of semiconductor manufacturing.

Thin Film Process Control

The NovaScan 840 combines high-speed measurement, enabling measurement of wafers both before and after polishing. While the Company no longer markets this system, this system and prior generations used to be Nova's main revenue source.

The NovaScan 2020 and 2040 are the second generation of integrated thickness monitoring systems with enhanced spectral range, responding to the needs of the industry for emerging chemical mechanical polishing high-end applications of thin films and complex layer stacks.

The NovaScan 3030 and 3060 are the second generation of the 300-millimeter measuring system, with improved optics and motion system enabling high-speed measurement, and with broad spectral rage (ultraviolet to infrared) allowing accurate measurements on complex structures and thin film layers. The NovaScan 3060 integrated film thickness 300-millimeter measurement system was introduced during the year ended December 31, 2002.

The NovaScan 2020Cu has the same basic platform as the NovaScan 2040, with additional hardware and software improvements, enabling the system to answer the requirements of copper chemical mechanical polishing monitoring. The system went through several beta tests and was released for sale during the year ended December 31, 2003.

The NovaScan 3030Cu has same basic platform as the NovaScan 3030, with additional hardware and software improvements, enabling the system to answer the requirements of 300-millimeter copper CMP monitoring. The system was released for sale in 2003.

A closed loop control option for the NovaScan systems delivers highly automated wafer-to-wafer uniformity over chemical mechanical polishing manufacturing processes. The thickness data of every processed wafer is obtained and process parameters are fed back to adjust the next wafer polish.

NovaNet is a sophisticated computer network, connecting all NovaScan systems on a factory floor. The network is managed by a server, running with software developed by Nova, and insuring safe recipe distribution and recipe integrity across the factory. The NovaNet also includes a report generator that allows the creation of reports from all the systems connected and allows programmable cross sections.

The NovaScan 840CVD system is a 200-millimeter integrated metrology vacuum chemical vapor deposition measurement system, measuring different layers in the chemical vapor deposition process. Data can be fed forward to the chemical mechanical polishing

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